We employ novel methods of growing nanomaterials (ion implantation, atomic layer deposition, molecular beam epitaxy) and study them by surface characterization with sub-nanometer depth resolution (such as medium energy ion scattering), and atomic-scale lateral resolution (scanning probe microscopy). Notably, my research interests are to a large extent focused not on a particular class of materials, which is more common in material’s science areas, but rather on methods. Our group developed extensive expertise in medium energy ion scattering (MEIS), a high-resolution ion beam analysis technique capable of providing quantitative information on the structure and composition of shallow layers with sub-nm depth resolution near the surface. In addition to well-established applications of MEIS to study diffusion and oxidation processes, we have been re-examining fundamental parameters, such as the stopping cross section in the medium ion energy range.
Find more here: http://www.physics.uwo.ca/~lgonchar/research/interests/index.shtml